Laser Diode Test System
MLDTS-10N-1A
Laser Diode Test System MLDTS-10N-1A
 
This system is specifically designed to evaluate the performance of laser diode bars separated from wafers and CAN-packaged laser diodes. It provides high-precision measurements of electrical and optical parameters, including current–voltage (I-V) characteristics, current–optical output (I-L) characteristics, and emission spectra. The system can apply currents of up to 1 ampere with pulse widths as short as 50 nanoseconds, enabling evaluation while suppressing device heating. By minimizing thermal effects, it accurately measures the intrinsic characteristics of the device, making it useful for early-stage development and comparative device evaluation.

■Measurement Parameters
Item Description
Waveform Acquisition Drive current, optical output, and output voltage waveforms (narrow-pulse operation only)
Graphs Drive current–optical output (I-L) characteristics,
Drive current–output voltage (I-V) characteristics,
Temperature characteristics
Data Threshold current (Ith), slope efficiency (SE),
Drive current (Iop) and output voltage (Vop) at a specified optical output (Pop),
Optical output (PIf) and output voltage (VIf) at a specified drive current (If)
Polarization Measurement Acquired by manually rotating a polarizing prism
Emission Spectrum Measured using a spectroscopy system

■Specifications
Item Narrow Pulse Wide Pulse
Maximum Drive Current 1 A 1 A
Setting Resolution 0.1 mA 0.1 mA
Maximum Output Voltage 30 V 30 V
Drive Mode Pulse CW / Pulse
Drive Polarity Unipolar Unipolar
Drive Method Constant voltage Constant current
Pulse Width 50 ns–10 μs 1 μs–1 ms
Duty Cycle 1% 50%

*Specifications and appearance are subject to change without notice for product improvement.

■About Laser Diode Bars
A laser diode bar (LD bar) is an intermediate device form produced during laser diode manufacturing by separating rows of devices formed on a wafer into straight bars. Each bar is subsequently divided into individual chips, which are mounted in CAN packages or other packages to create finished products.

■Purpose and Importance of LD Bar Testing
Laser diode bars represent an important intermediate stage before packaging. Characterization at this stage is essential for product quality control and manufacturing efficiency.
Measuring the electrical and optical characteristics of individual devices while they are still in bar form offers several benefits, including improved yield, early detection of defective devices, and greater manufacturing process stability.
The main measurement parameters are:
  • Current–voltage (I-V) characteristics
  • Current–optical output (I-L) characteristics
  • Threshold current and slope efficiency
  • Emission spectrum (wavelength and bandwidth)
  • Chip-to-chip variation
To avoid the effects of self-heating, measurements use extremely short drive pulses, such as 50-nanosecond pulses. This minimizes thermal effects and enables high-precision evaluation of the intrinsic device characteristics.
The information obtained from these measurements supports chip sorting and process optimization and directly contributes to improved reliability of the final products.