UV-VIS Microscopic Imaging Spectroscopy System
MISM-08

UV-VIS Microscopic Imaging Spectroscopy System MISM-08

This system was developed for in-situ two-dimensional spectroscopic measurements of microscopic areas inside a vacuum chamber at a rate of 3–5 fps. Microscope optics with chromatic aberration correction across the ultraviolet and visible regions enable two-dimensional spectroscopic measurements from 250 nm to 600 nm. Designed to measure samples inside a vacuum chamber, the system provides long working distances of approximately 270 mm at approximately 2.5× magnification and approximately 168 mm at approximately 4.8× magnification.

■Two-Dimensional Spectroscopic Measurement Examples

Measurement data 1: test target at 500 nm Measurement data 2: test target at 253.7 nm
Measurement Data 1 Measurement Data 2
  • Sample: Test target
  • Wavelength: 500 nm
  • Magnification: Approximately 2.5×
  • Measurement area: Approximately 1.2 mm × 1.1 mm
  • Measurement time: Approximately 280 ms
  • Sample: Test target
  • Wavelength: 253.7 nm
  • Magnification: Approximately 4.8×
  • Measurement area: Approximately 0.63 mm × 0.2 mm
  • Measurement time: Approximately 200 ms

■Specifications

Wavelength Range 250 nm–600 nm
Wavelength Resolution Approximately 0.34 nm/pixel
Magnification Approximately 2.5× and 4.8×
Working Distance Approximately 270 mm (at approximately 2.5×), approximately 168 mm (at approximately 4.8×)
Spatial Resolution 20 μm (at approximately 2.5×), 10 μm (at approximately 4.8×)
Measurement Area Approximately 1.24 mm × 1.24 mm (at approximately 2.5×), approximately 0.64 mm × 0.64 mm (at approximately 4.8×)
Measurement Rate 3–5 fps
*Measurement time varies depending on the frame size.

*Specifications and appearance are subject to change without notice for product improvement.